名稱：GATTA-AFM (原子力顯微鏡)納米尺

應(yīng)用：用于原子力顯微鏡測試及校準

Testing the achievable resolution of atomic force microscopes under realistic conditions is important in order to know the possibilities but also the limits of real applications. With GATTA?AFM nanorulers， now adequate test samples are finally available. These DNA-based samples are in a well-defined rectangular shape with a size of 70 nm times 90 nm and a height of 2 nm. The GATTA-AFM nanorulers represent accurate and highly parallelized structures and are therefore perfectly suited to optimize and test the resolution of atomic force microscopes.

The samples are shipped in solution. The amount of material is sufficient for at least 10 AFM surfaces， densely packed with DNA?origami rectangles. The ladder like substructure in the middle of the GATTA-AFM sample shows a line spacing of around 6 nm. Samples are shipped in solution.